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The temperature coefficient of resistivity (θT) of carbon-based materials is a critical property that directly determines their electrical response upon thermal impulses. It could have metal- (positive) or semiconductor-like (negative) behavior, depending on the combined temperature dependence of electron density and electron scattering. Its distribution in space is very difficult to measure and is rarely studied. Here, for the first time, we report that carbon-based micro/nanoscale structures have a strong non-uniform spatial distribution of θT. This distribution is probed by measuring the transient electro-thermal response of the material under extremely localized step laser heating and scanning, which magnifies the local θT effect in the measured transient voltage evolution. For carbon microfibers (CMFs), after electrical current annealing, θT varies from negative to positive from the sample end to the center with a magnitude change of >130% over <1 mm. This θT sign change is confirmed by directly testing smaller segments from different regions of an annealed CMF. For micro-thick carbon nanotube bundles, θT is found to have a relative change of >125% within a length of ∼2 mm, uncovering strong metallic to semiconductive behavior change in space. Our θT scanning technique can be readily extended to nm-thick samples with μm scanning resolution to explore the distribution of θT and provide a deep insight into the local electron conduction. 

Alzheimer's disease (AD) is a neurodegenerative disorder with slow onset, which could result in the deterioration of the duration of persistent neurological dysfunction. How to identify the informative longitudinal phenotypic neuroimaging markers and predict cognitive measures are crucial to recognize AD at early stage. Many existing models related imaging measures to cognitive status using regression models, but they did not take full consideration of the interaction between cognitive scores. In this paper, we propose a robust low-rank structured sparse regression method (RLSR) to address this issue. The proposed model simultaneously selects effective features and learns the underlying structure between cognitive scores by utilizing novel mixed structured sparsity inducing norms and low-rank approximation. In addition, an efficient algorithm is derived to solve the proposed non-smooth objective function with proved convergence. Empirical studies on cognitive data of the ADNI cohort demonstrate the superior performance of the proposed method. 

Support Vector Machine (SVM) is originally proposed as a binary classification model, and it has already achieved great success in different applications. In reality, it is more often to solve a problem which has more than two classes. So, it is natural to extend SVM to a multi-class classifier. There have been many works proposed to construct a multi-class classifier based on binary SVM, such as one versus all strategy, one versus one strategy and Weston's multi-class SVM. One versus all strategy and one versus one strategy split the multi-class problem to multiple binary classification subproblems, and we need to train multiple binary classifiers. Weston's multi-class SVM is formed by ensuring risk constraints and imposing a specific regularization, like Frobenius norm. It is not derived by maximizing the margin between hyperplane and training data which is the motivation in SVM. In this paper, we propose a multi-class SVM model from the perspective of maximizing margin between training points and hyperplane, and analyze the relation between our model and other related methods. In the experiment, it shows that our model can get better or compared results when comparing with other related methods. 

Domain adaptation problems arise in a variety of applications, where a training dataset from the source domain and a test dataset from the target domain typically follow different distributions. The primary difficulty in designing effective learning models to solve such problems lies in how to bridge the gap between the source and target distributions. In this paper, we provide comprehensive analysis of feature learning algorithms used in conjunction with linear classifiers for domain adaptation. Our analysis shows that in order to achieve good adaptation performance, the second moments of the source domain distribution and target domain distribution should be similar. Based on our new analysis, a novel extremely easy feature learning algorithm for domain adaptation is proposed. Furthermore, our algorithm is extended by leveraging multiple layers, leading to another feature learning algorithm. We evaluate the effectiveness of the proposed algorithms in terms of domain adaptation tasks on Amazon review and spam datasets from the ECML/PKDD 2006 discovery challenge.